"AURIGA TM", Zeiss
High-resolution scanning electron microscopy is suitable for a wide range of applications in the field of materials characterisation and, due to its high depth of focus, is preferred for imaging unevenly structured surfaces. In addition, it is used to characterise micro- and nanostructures for materials research and development as well as for quality assurance and damage analysis.
We offer:
- High-resolution images of your objects down to the nanometer scale with excellent depth of field
- Specialization in plastics as well as other organic and inorganic materials such as cellulose or oxides: charge compensation, no radiation damage to your objects, highest resolution, and sharp contrast
- Confidential, professional, and prompt processing of your orders
- Our contributions to solving your material challenges as well as our expert support in the implementation of your project
Application examples
- Morphological examination of cross-sections to elucidate layer structures
- Phase distribution in plastic blends
- Investigation of surface topography
- Fracture surfaces in plastic components
- Media attacks and their material wear phenomena
- Defective surface coatings, roughnesses
- Crazes, cracks, fibre-matrix adhesion, fibre distribution
- Pigment and filler distribution
- Analysis of material inhomogeneities (blowholes, inclusions)
- Structure measurement
- Detection and measurement of impurities
- Investigations by means of material contrast
- Spherulite structures and processing influence
- EDX X-ray micro-range analysis for material identification
Analytical methods
- FT-IR spectroscopy
- FT-IR imaging microscopy
- Optical microscopy
- Polarization microscopy
- Tensiometer:
- Contact angle
- Interfacial tension
- Surface energy
- Vibrating table with climate chamber
and more at our subsidiary OMPG.